| PART |
Description |
Maker |
| GET-30497 |
Qualification Test Results
|
CEL
|
| GET-30569 |
Qualification Test Results on NE272 ser es
|
CEL[California Eastern Labs]
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Labs
|
| SGA-9189 |
Reliability Qualification Report
|
Stanford Microdevices
|
| EFM32ZG222F4-QFP48 |
Updated specifications based on the results of additional silicon characterization.
|
Silicon Laboratories
|
| TS87C51RD2 TS83C51RD2 |
Qualification Package TS87C51RD2 / TS83C51RD2 CMOS 0.5Um
|
ATMEL[ATMEL Corporation]
|
| KDB15N50 |
Low Gate Charge Qg results in Simple Drive Requirement Reduced rDS(ON)
|
TY Semiconductor Co., L...
|
| AS8221-ASSP |
FlexRay??Standard Transceiver; Package Type: SSOP-20; Temperature Range: -40 - 125 掳C; Automotive Qualification: X
|
Austriamicrosystems AG
|
| EFM32G290F32-BGA112 EFM32G890F32-BGA112 EFM32G840F |
Updated specifications based on the results of additional silicon characterization
|
Silicon Laboratories
|
| C4000-VOIP C4000-IPTV C4000-VOIP-UNISTIM C4000-VOI |
T-BERD㈢/MTS-4000Multiple Services Test Platform
T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
|
JDS Uniphase Corporation
|
